ISO 11505:2025
International Standard
Current Edition
·
Approved on
19 June 2025
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
ISO 11505:2025 Files
English
34 Pages
Current Edition
74.03 OMR
ISO 11505:2025 Scope
This document specifies a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
The applicability of this document is limited to description of general procedures for quantification of the chemical composition and thickness in GD-OES compositional depth profiling. This document is not directly applicable for quantification of individual materials having various thicknesses and elements to be determined.
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