ISO 14975:2000
International Standard
Current Edition
·
Approved on
07 December 2000
Surface chemical analysis — Information formats
ISO 14975:2000 Files
English
17 Pages
Current Edition
46.97 OMR
ISO 14975:2000 Scope
This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion
and revision of a surface chemical analysis spectral database. The format is applied to Auger electron
spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.
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