ISO 24688:2022
International Standard
Current Edition
·
Approved on
22 July 2022
Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods
ISO 24688:2022 Files
English
8 Pages
Current Edition
OMR
33.02
ISO 24688:2022 Scope
This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).
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