ISO 24173:2009
International Standard
Historical
·
Approved on
14 September 2009
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 24173:2009 Files
English
43 Pages
Historical
85.64 OMR
ISO 24173:2009 Scope
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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