GSO ISO 9342-1:2024
ISO 9342-1:2023
Gulf Standard
Current Edition
·
Approved on
14 October 2024
Optics and optical instruments — Test lenses for calibration of focimeters — Part 1: Reference lenses for focimeters used for measuring spectacle lenses
GSO ISO 9342-1:2024 Files
No files are available for this standard right now!
GSO ISO 9342-1:2024 Scope
This document specifies requirements for reference lenses for the calibration and verification of focimeters that are used for the measurement of spectacle form lenses, e.g. those complying with ISO 8598-1. It also gives a method for the determination of the back vertex power of the reference lenses.
NOTE It is accepted that other reference lenses can also be used with powers within the given range, manufactured to the same standard of accuracy and form, but different back vertex powers. However, only lenses with integer nominal powers, as described in 4.1, can be used for the calibration of digitally-rounding focimeters.
Best Sellers From Metrology Sector
GSO OIML R87:2021
OIML R87:2016
Gulf Standard
Quantity of product in prepackages
GSO OIML R79:2021
OIML R79:2015
Gulf Standard
Labeling requirements for prepackages
OS GSO OIML R76-1:2009
OIML R 76-1:2006
Omani Standard
Non-automatic weighing instruments –
Part 1: Metrological and technical requirements - Tests
GSO OIML R 76-1:2009
OIML R 76-1:2006
Gulf Standard
Non-automatic weighing instruments –
Part 1: Metrological and technical requirements - Tests
Recently Published from Metrology Sector
GSO IEC 62055-31:2024
IEC 62055-31:2022
Gulf Standard
Electricity metering - Payment systems - Part 31: Particular requirements - Static payment meters for active energy (classes 0,5, 1 and 2)
GSO ISO 16399:2024
ISO 16399:2023
Gulf Standard
Agricultural irrigation equipment
— Meters for irrigation water
GSO ISO 80004-1:2024
ISO 80004-1:2023
Gulf Standard
Nanotechnologies – Vocabulary
— Part 1: Core vocabulary
GSO ISO 19749:2024
ISO 19749:2021
Gulf Standard
Nanotechnologies
— Measurements of particle size and shape distributions by scanning electron microscopy