GSO IEC 62047-16:2021
IEC 62047-16:2015
Gulf Standard
Current Edition
·
Approved on
01 July 2021
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
GSO IEC 62047-16:2021 Files
English
21 Pages
Current Edition
Reference Language
Obtaining this standard through the store is currently unavailable. You can acquire it directly from its source.
GSO IEC 62047-16:2021 Scope
IEC 62047-16:2015 specifies the test methods to measure the residual stresses of films with thickness in the range of 0,01 μ to 10 μ in MEMS structures fabricated by wafer curvature or cantilever beam deflection methods.
Best Sellers From Electrical Sector
GSO 2530:2016
Gulf Standard
Energy Labelling And Minimum Energy Performance Requirements For Air-Conditioners
OS GSO 2530:2016
GSO 2530:2016
Omani Standard
Energy Labelling And Minimum Energy Performance Requirements For Air-Conditioners
OS GSO 34:2007
GSO 34:2007
Omani Standard
LEAD-ACID STARTER BATTERIES USED FOR
MOTOR VEHICLES AND INTERNAL
COMBUSTION ENGINES
GSO 34:2007
Gulf Technical Regulation
LEAD-ACID STARTER BATTERIES USED FOR
MOTOR VEHICLES AND INTERNAL
COMBUSTION ENGINES
Recently Published from Electrical Sector
GSO 195:1994
Gulf Standard
METHODS OF TEST FOR
ADHESIVE INSULATING TAPES FOR
ELECTRICAL PURPOSES
GSO 31:1984
Gulf Standard
METHODS OF TEST FOR
PVC-INSULATED CABLES AND CORDS
WITH CIRCULAR COPPER CONDUCTORS
OS GSO 195:1994
GSO 195:1994
Omani Standard
METHODS OF TEST FOR
ADHESIVE INSULATING TAPES FOR
ELECTRICAL PURPOSES
GSO 723:1997
Gulf Standard
Methods of test for telephone sets.