GSO IEC 62418:2021
IEC 62418:2010
Gulf Standard
Current Edition
·
Approved on
01 July 2021
Semiconductor devices - Metallization stress void test
GSO IEC 62418:2021 Files
English
34 Pages
Current Edition
Reference Language
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GSO IEC 62418:2021 Scope
IEC 62418:2010 describes a method of metallization stress void test and associated criteria. It is applicable to aluminium (Al) or copper (Cu) metallization.
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