This International Standard applies to solid-state photodiodes (PD) and solid-state photodiode arrays (PDA) used in scintillation detectors or in Cherenkov detectors. Avalanche photodiodes (APD) are also covered by the test methods recommended in this standard, but they need some additional specific tests also described in this standard. Not all tests described in this standard are mandatory, but tests that are used to specify performance should be carried out in accordance with the procedures described herein. The intent of this standard is to establish standard test procedures for photodiodes used in scintillation detectors and to define the parameters which shall be provided by the supplier for each type of photodiode.