GSO IEC 62374-1:2013
IEC 62374-1:2010
Gulf Standard
Current Edition
·
Approved on
31 December 2013
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
GSO IEC 62374-1:2013 Files
English
32 Pages
Current Edition
Reference Language
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GSO IEC 62374-1:2013 Scope
IEC 62374-1:2010 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.
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