OS GSO IEC 63284:2024

IEC 63284:2022

Omani Standard Current Edition · Approved on 31 January 2024

Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors

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OS GSO IEC 63284:2024 Scope

IEC 63284:2022 covers the protocol of performing a stress procedure and a corresponding test method to evaluate the reliability of gallium nitride (GaN) power transistors by inductive load switching, specifically hard-switching stress

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