OS GSO IEC 63284:2024
IEC 63284:2022
Omani Standard
Current Edition
·
Approved on
31 January 2024
Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
OS GSO IEC 63284:2024 Files
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OS GSO IEC 63284:2024 Scope
IEC 63284:2022 covers the protocol of performing a stress procedure and a corresponding test method to evaluate the reliability of gallium nitride (GaN) power transistors by inductive load switching, specifically hard-switching stress
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