OS GSO IEC 61580-9:2017
IEC 61580-9:1996
Omani Standard
Current Edition
·
Approved on
03 October 2017
Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces
OS GSO IEC 61580-9:2017 Files
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OS GSO IEC 61580-9:2017 Scope
This part of IEC 1580 gives the means for determining the reflection coefficient at the junction of two similar rectangular waveguides due to the following imperfections:
a) differences in the waveguide internal dimensions;
b) lateral displacement between the waveguide axes in either the H or E plane;
c) angular misalignment between the waveguide axes.
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