OS GSO IEC 61445:2017
IEC 61445:2012
Omani Standard
Current Edition
·
Approved on
03 October 2017
Digital Test Interchange Format (DTIF)
OS GSO IEC 61445:2017 Files
English
101 Pages
Current Edition
Reference Language
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OS GSO IEC 61445:2017 Scope
This standard defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Faults Dictionary;
d) Probe.
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