OS GSO IEC 60444-2:2015
IEC 60444-2:1980
Omani Standard
Current Edition
·
Approved on
03 September 2015
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
OS GSO IEC 60444-2:2015 Files
English
18 Pages
Current Edition
Reference Language
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OS GSO IEC 60444-2:2015 Scope
This standard describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
The advantage of this method is that it uses only the measuring circuit described in I E C Publication 444 and therefore avoids the use of additional elements or instruments which could be sources of error.
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