OS GSO IEC 60749-5:2014
IEC 60749-5:2003
Omani Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
OS GSO IEC 60749-5:2014 Files
English
13 Pages
Current Edition
Reference Language
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OS GSO IEC 60749-5:2014 Scope
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
NOTE This test is in general accord with IEC 60068-2-3 (withdrawn)1, but due to specific requirements of semiconductors, the following text is applied.
This test method is considered destructive.
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