OS GSO IEC 60749-16:2014
IEC 60749-16:2003
Omani Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
OS GSO IEC 60749-16:2014 Files
English
13 Pages
Current Edition
Reference Language
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OS GSO IEC 60749-16:2014 Scope
The purpose of this part of IEC 60749 is to detect the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).
The test of particle impact noise detection is classified as non-destructive.
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