ISO 17297:2025
International Standard
Current Edition
·
Approved on
26 May 2025
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
ISO 17297:2025 Files
English
14 Pages
Current Edition
47.04 OMR
ISO 17297:2025 Scope
This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
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