OS GSO IEC 60749-13:2014
IEC 60749-13:2002
Omani Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
OS GSO IEC 60749-13:2014 Files
English
9 Pages
Current Edition
Reference Language
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OS GSO IEC 60749-13:2014 Scope
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of
semiconductor devices to corrosion. It is an accelerated test that simulates the effects of
severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices
specified for a marine environment.
The salt atmosphere test is considered destructive
In general, this salt atmosphere test is in conformity with IEC 60068-2-11 but, due to specific
requirements of semiconductors, the clauses of this standard apply.
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